Browsing by Author XINGTAO Ai

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Publication YearJRC N°TitleAuthor(s), Editor(s), Other Contributor(s)Publication Type
2000JRC18255Al and Ti Secondary Neutral and Secondary Ion Emission from Oxide Samples in the High Frequency Sputtering Mode of Hf-Plasma SNMS.XINGTAO Ai; BUBERT H.; HUTTER H.; GRITSCH M.; BOERNER H.; SUNDERKOETTER Jan detlef; JENETT HolgerArticles in Journals