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Browsing by Author BERGER A.

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Publication YearTitleAuthor(s), Editor(s), Other Contributor(s)Publication Type
2000Antimony Implanted in Silicon. A Thin Layer Reference Material for Surface Analysis.ECKER K.h.; BERGER A.; GROETZSCHEL Rainer; PERSSON Leif; WAETJEN UweContributions to Conferences
2001Certification of Antinomy Implanted in Silicon Wafer with a Silicon Dioxide Diffusion BarrierECKER K.h.; WAETJEN Uwe; BERGER A.; GROETZSCHEL Rainer; PERSSON Leif; PRITZKOW W.; RADTKE M.; RIEBE G.EUR - Scientific and Technical Research Reports
2001Contribution of ICP-IDMS to the Certification of Antimony Implanted in a Silicon Wafer - Comparison with RBS and INAA Results.PRITZKOW W.; VOGL Jochen; BERGER A.; ECKER K.h.; GROETZSCHEL Rainer; KLINGBEIL B.; PERSSON Leif; RIEBE G.; WAETJEN UweArticles in Journals
2010International Comparison of the Determination of the Mass Fraction of Cadmium, Chromium, Mercury and Lead in Polypropylene: the Comité Consultatif pour la Quantité de Matière Pilot Study CCQM-P106MA Liandi; FENG Liuxing; HIOKI A; CHO K.h.; VOGL J.; BERGER A.; TURK Gregory; MACLEOD S.; LABARRAQUE G.; TONG W.f., et alArticles in Journals
2002RBS, SY-XRF, INAA and ICP-IDMS of Antimony Implanted in Silicon. A Multi-Method Approach to Characterize and Certify a Reference Material.ECKER K.h.; WAETJEN Uwe; BERGER A.; PERSSON Leif; PRITZKOW W.; RADTKE M.; RIESEMEIER H.Articles in Journals
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The mission of the JRC is to provide customer-driven scientific and technical support for the conception, development, implementation and monitoring of EU policies. As a service of the European Commission, the JRC functions as a reference centre of science and technology for the Union. Close to the policy-making process, it serves the common interest of the Member States, while being independent of special interests, whether private or national.
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