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Browsing by Author GISSLER Wolfram

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Showing results 1 to 20 of 38
Publication YearTitleAuthor(s), Editor(s), Other Contributor(s)Publication Type
1992Advanced Techniques for Surface EngineeringGISSLER WolframEUR - Scientific and Technical Research Reports
1994Auger Electron SpectroscopyStudies on TiNxGISSLER Wolfram; HAUPT JustusArticles in Journals
1996Chemical Sputtering of Carbon Films by Low Energy N2+ Ion BombardmentGISSLER WolframArticles in Journals
1997Co-sputtered Films within the Quasi-Binary System TiN-TiB2.LOSBICHLER P.; MITTERER C.; GIBSON Peter neil; GISSLER Wolfram; HOFER F.; WARBICHLER P.Contributions to Conferences
1997A Combined X-Ray Photoelectron/Auger Electron Spectroscopy/glancing Angle X-Ray Diffractiion/Extended X-ray Absorption Fine Structure Investigation of TiBxNy Coatings.MOLLART Timothy peter; GIBSON Peter neil; GISSLER WolframArticles in Journals
1999Comparative Investigation of Multilayer TiB2/C and Co-Sputtered TiB2/C Coatings for Low-Fraction Applications.GILMORE Richard; GISSLER Wolfram; GIBSON Peter neilContributions to Conferences
1997A Comparative Study of the Tribological Behaviour of Homogeneous and Multilayer Ti-B-N CoatingsMOLLART Timothy peter; GIBSON Peter neil; HAUPT Justus; GISSLER WolframContributions to Conferences
1990Comparative Study of TiNx Films Deposited by Reactive Ion Beam Sputtering at 77 and 300 KMANARA Adriano; GISSLER Wolfram; HAUPT Justus; BUSCHERT R.c.; GIBSON Peter; JIANG X.; REICHELT K.Contributions to Conferences
1988The Deposition of Amorphous Silicon Films by the Technique of Magnetron SputteringGISSLER Wolfram; HAUPT Justus; HOFFMANN Armin; ARENZ H.; SCHUBERT RainerEUR - Scientific and Technical Research Reports
1995Determination of the Compositionm of TiNx and TiBxNy Films by AESHAUPT Justus; GISSLER WolframArticles in Journals
1997Dual Ion Beam Deposition of Carbon Nitride Films at Low TemperaturesHAMMER Peter; LENARDI Cristina; HAUPT Justus; GISSLER WolframContributions to Conferences
1991Elastic Constants and Hardness of Ion Beam Sputtered TiNx Films Measured by Brillouin Scattering and Depth-Sensing IndentationGISSLER Wolfram; HAUPT Justus; JIANG X.; WANG M.; SCHMIDT K.Articles in Journals
1991Evidence for Mixed-Phase Nanocrystalline Boron Nitride FilmsGISSLER Wolfram; HAUPT Justus; GIBSON Peter; CRABB T.a.Contributions to Conferences
1988Facilities for Testing Hydrogenated Amorphous Silicon Films in the JRC-IspraGISSLER Wolfram; HAUPT JustusEUR - Scientific and Technical Research Reports
1994Hardness and Elasticity of Diamond-Like Carbon Films Prepared by Ion Beam Assisted Sputter DepositionGISSLER Wolfram; HAUPT JustusArticles in Journals
1992Hardness and Young's Modulus of Diamond-Like Carbon Films Prepared by Ion Beam MethodsGISSLER Wolfram; HAUPT JustusContributions to Conferences
1989Ion Beam Mixing and Characterisation of a Copper/Silver Three-Layer SystemMANARA Adriano; GISSLER Wolfram; HAUPT Justus; ARENZ H.; GIBSON Peter; BUSCHERT RobertEUR - Scientific and Technical Research Reports
1999Low Friction TiN-MoS2 Coatings Produced by dc Magnetron Co-Deposition.GISSLER Wolfram; GILMORE Richard; STOIBER Monika; LOSBICHLER Paul; MITTERER C.Contributions to Conferences
1997Low Temperature Sputter Deposition and Characterisation of Carbon Nitride Films.HAMMER Peter; LENARDI Cristina; GISSLER Wolfram; HAUPT JustusContributions to Conferences
1999Microstructural and Mechanical Properties of Multilayer TiB2/C and Co-Sputtered TiB2/C Coatings for Cutting Tools.GILMORE Richard; LENARDI Cristina; GIBSON Peter neil; GISSLER WolframContributions to Conferences
Showing results 1 to 20 of 38

 

The mission of the JRC is to provide customer-driven scientific and technical support for the conception, development, implementation and monitoring of EU policies. As a service of the European Commission, the JRC functions as a reference centre of science and technology for the Union. Close to the policy-making process, it serves the common interest of the Member States, while being independent of special interests, whether private or national.
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