Browsing by Author PRITZKOW W.

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Showing results 1 to 5 of 5
Publication YearJRC N°TitleAuthor(s), Editor(s), Other Contributor(s)Publication Type
2001JRC22664Certification of Antinomy Implanted in Silicon Wafer with a Silicon Dioxide Diffusion BarrierECKER K.h.; WAETJEN Uwe; BERGER A.; GROETZSCHEL Rainer; PERSSON Leif; PRITZKOW W.; RADTKE M.; RIEBE G.EUR - Scientific and Technical Research Reports
2007JRC36971Certification of the Sulfur Mass Fraction in Three Commercial Petrol Materials, ERM-EF211, ERM-EF212, ERM-EF213ANDRZEJUK W.; BAU' ANDREA; CHAROUD-GOT JEAN; DE VOS PAUL; EMTEBORG HAKAN; HEARN R.; LAMBERTY ANDREE; LINSINGER THOMAS; OOSTRA ALBERT; PRITZKOW W., et alEUR - Scientific and Technical Research Reports
2001JRC22683Contribution of ICP-IDMS to the Certification of Antimony Implanted in a Silicon Wafer - Comparison with RBS and INAA Results.PRITZKOW W.; VOGL Jochen; BERGER A.; ECKER K.h.; GROETZSCHEL Rainer; KLINGBEIL B.; PERSSON Leif; RIEBE G.; WAETJEN UweArticles in Journals
2007JRC36771Production of Three Certified Reference Materials for the Sulfur Content in Gasoline (petrol)LINSINGER THOMAS; ANDRZEJUK W.; BAU' ANDREA; CHAROUD-GOT JEAN; DE VOS PAUL; EMTEBORG HAKAN; HEARN R.; LAMBERTY ANDREE; OOSTRA ALBERT; PRITZKOW W., et alArticles in Journals
2002JRC22686RBS, SY-XRF, INAA and ICP-IDMS of Antimony Implanted in Silicon. A Multi-Method Approach to Characterize and Certify a Reference Material.ECKER K.h.; WAETJEN Uwe; BERGER A.; PERSSON Leif; PRITZKOW W.; RADTKE M.; RIESEMEIER H.Articles in Journals