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Please use this identifier to cite or link to this item: http://publications.jrc.ec.europa.eu/repository/handle/111111111/14500

Title: Ion Beam Mixing in Uranium Nitride Thin Films Studied by Rutherford Backscattering Spectroscopy
Authors: KIM-NGAN N.-T.h
BALOGH A.g.
HAVELA L.
GOUDER Thomas
Citation: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS vol. 268 no. 11-12 p. 1875-1879
Publisher: ELSEVIER SCIENCE BV
Publication Year: 2010
JRC Publication N°: JRC59250
ISSN: 0168-583X
URI: www.elsevier.com/locate/nimb
http://publications.jrc.ec.europa.eu/repository/handle/111111111/14500
DOI: 10.1016/j.nimb2010.02.015
Type: Articles in Journals
Appears in Collections:Institute for Transuranium Elements

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