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Please use this identifier to cite or link to this item: http://publications.jrc.ec.europa.eu/repository/handle/111111111/1730

Title: High Pressure X-Ray Diffraction Studies of UX3 (X = Al, Si, Ga, Ge, In, Sn)
Authors: LE BIHAN Tristan
DARRACQ Stephane
ABRAHAM Hans christian
WINAND Jean marc
BENEDICT Ulrich gottfried
Citation: High Temperatures - High Pressures vol. 27-28 p. 157-162
Publication Year: 1996
JRC Publication N°: JRC12650
URI: http://publications.jrc.ec.europa.eu/repository/handle/111111111/1730
Type: Articles in Journals
Appears in Collections:Institute for Transuranium Elements

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