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Please use this identifier to cite or link to this item: http://publications.jrc.ec.europa.eu/repository/handle/111111111/23105

Title: Promises and pitfalls in the reliable determination of 233U using high resolution ICP-OES
Authors: KRACHLER MICHAEL
WEGEN Detlef
Citation: JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY vol. 27 p. 335-339
Publisher: ROYAL SOC CHEMISTRY
Publication Year: 2012
JRC Publication N°: JRC67158
ISSN: 0267-9477
URI: http://pubs.rsc.org/en/content/articlehtml/2012/ja/c1ja10288e?page=search
http://publications.jrc.ec.europa.eu/repository/handle/111111111/23105
DOI: 10.1039/C1JA10288E
Type: Articles in Journals
Appears in Collections:Institute for Transuranium Elements

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