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Please use this identifier to cite or link to this item: http://publications.jrc.ec.europa.eu/repository/handle/111111111/5353

Title: Full-field Heterodyne Interferometry Using a Complementary Metal-oxide Semiconductor Digital Signal Processor Camera for High-resolution Profilometry
Authors: AGUANNO Mauro V.
LAKESTANI FEREYDOUN
WHELAN MAURICE
CONNELLY Michael J.
Citation: OPTICAL ENGINEERING vol. 46 no. 9 p. 095601
Publisher: SPIE-INT SOCIETY OPTICAL ENGINEERING
Publication Year: 2007
JRC Publication N°: JRC42029
ISSN: 0091-3286
URI: http://publications.jrc.ec.europa.eu/repository/handle/111111111/5353
DOI: 10.1117/1.2779346
Type: Articles in Journals
Appears in Collections:Institute for Health and Consumer Protection

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