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Please use this identifier to cite or link to this item: http://publications.jrc.ec.europa.eu/repository/handle/111111111/8797

Title: Atomic Force Microscopy Characterization of the Chemical Contrast of Nanoscale Patterns Fabricated by Electron Beam Lithography on Polyethylene Glycol Oxide Thin Films
Authors: SIRGHI Lucel
BRETAGNOL Frederic
MORNET Stephane
GILLILAND Douglas
COLPO Pascal
ROSSI Francois
SASAKI T.
Citation: ULTRAMICROSCOPY vol. 109 no. 3 p. 222-229
Publisher: ELSEVIER SCIENCE BV
Publication Year: 2009
JRC Publication N°: JRC50459
ISSN: 0304-3991
URI: http://publications.jrc.ec.europa.eu/repository/handle/111111111/8797
DOI: 10.1016/j.ultramic.2008.10.022
Type: Articles in Journals
Appears in Collections:Institute for Health and Consumer Protection

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