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|Title:||High Pressure X-Ray Diffraction Studies of UX3 (X = Al, Si, Ga, Ge, In, Sn)|
|Authors:||LE BIHAN Tristan; DARRACQ Stephane; ABRAHAM Hans christian; WINAND Jean marc; BENEDICT Ulrich gottfried|
|Citation:||High Temperatures - High Pressures vol. 27-28 p. 157-162|
|Type:||Articles in periodicals and books|
|Abstract:||Several intermetallic uranium compounds UX3 (X = Al, Si, Ga, Ge, In, Sn) were studied under high pressure up to ca. 40 GPa (except UGa3 up to 80 GPa) using a diamond anvil cell and energy dispersive X-ray diffraction facilities. The compounds which have the cubic AuCu3 structure, do not show any crystallographic phase transition in the domain of investigation.|
|JRC Institute:||Nuclear Safety and Security|
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