Title: High Pressure X-Ray Diffraction Studies of UX3 (X = Al, Si, Ga, Ge, In, Sn)
Authors: LE BIHAN TristanDARRACQ StephaneABRAHAM Hans christianWINAND Jean marcBENEDICT Ulrich gottfried
Citation: High Temperatures - High Pressures vol. 27-28 p. 157-162
Publication Year: 1996
JRC N°: JRC12650
URI: http://publications.jrc.ec.europa.eu/repository/handle/JRC12650
Type: Articles in Journals
Abstract: Several intermetallic uranium compounds UX3 (X = Al, Si, Ga, Ge, In, Sn) were studied under high pressure up to ca. 40 GPa (except UGa3 up to 80 GPa) using a diamond anvil cell and energy dispersive X-ray diffraction facilities. The compounds which have the cubic AuCu3 structure, do not show any crystallographic phase transition in the domain of investigation.
JRC Institute:Institute for Transuranium Elements

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