Title: Comparative Study of RBS, SIMS and VASE for Characterisation of High Electron Mobility Transistors.
Authors: PERSSON LeifLOEVESTAM N.g.SOEDERVALL UlfWAETJEN Uwe
Citation: Nuclear Instruments and Methods in Physics Research B vol. 161-163 p. 482-486
Publication Year: 2000
JRC N°: JRC18644
URI: http://publications.jrc.ec.europa.eu/repository/handle/JRC18644
Type: Contributions to Conferences
Abstract: Abstract not available
JRC Institute:Institute for Reference Materials and Measurements

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