Title: The IVD-MD Directive: A Need for Reference Systems of a Higher Metrological Order.
Authors: SCHIMMEL HeinzKRISTIANSEN N.BAPTIST M.PAUWELS Jean
Citation: Special issue of Fresenius' Journal of Analytical Chemistry
Publication Year: 2000
JRC N°: JRC20549
URI: http://publications.jrc.ec.europa.eu/repository/handle/JRC20549
Type: Contributions to Conferences
Abstract: Abstract not available
JRC Institute:Institute for Reference Materials and Measurements

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