Title: X-Ray Photoelectron Spectroscopy on Uranium Oxides. A Comparison between Bulk and Thin Layers.
Authors: VAN DEN BERGHE S.MISERQUE F.GOUDER ThomasGAUDREAU B.VERWERFT Marc
Citation: Journal of Nuclear Materials vol. 294 p. 168-174
Publication Year: 2001
JRC Publication N°: JRC21705
URI: http://publications.jrc.ec.europa.eu/repository/handle/JRC21705
Type: Articles in Journals
Abstract: Abstract not available
JRC Institute:Institute for Transuranium Elements

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