Title: RBS, SY-XRF, INAA and ICP-IDMS of Antimony Implanted in Silicon. A Multi-Method Approach to Characterize and Certify a Reference Material.
Authors: ECKER K.h.WAETJEN UweBERGER A.PERSSON LeifPRITZKOW W.RADTKE M.RIESEMEIER H.
Citation: Nuclear Instruments and Method.sin Physics Research B vol. 188 p. 125-125
Publisher: Elsevier
Publication Year: 2002
JRC Publication N°: JRC22686
URI: http://publications.jrc.ec.europa.eu/repository/handle/JRC22686
Type: Articles in Journals
Abstract: Abstract not available
JRC Institute:Institute for Reference Materials and Measurements

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