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|Title:||Installation of a Shielded Secondary Ion Mass Spectrometer for the Analysis of Irradiated Nuclear Fuels|
|Authors:||BREMIER STEPHAN; HASNAOUI RACHID; PORTIER Stephane; BILDSTEIN Olivier; WALKER CLIVE|
|Citation:||MIKROCHIMICA ACTA vol. 155 p. 113-120|
|Type:||Articles in periodicals and books|
|Abstract:||A CAMECA IMS 6F secondary ion mass spectrometer (SIMS) for the analysis of irradiated nuclear fuel has been installed in the Microbeam Analysis Laboratory of the Institute for Transuranium Elements (ITU). This device is specially equipped with heavy metal radiation shielding to enable the safe examination of nuclear fuel samples with activities up to 75 GBq. At the Institute for Transuranium Elements, the SIMS will be used in conjunction with EPMA taking advantage of the complementary nature of the two techniques and will make important contributions to ongoing research programmes such as the safety of nuclear fuels, the partitioning and transmutation programme and the characterisation of spent fuels. The paper describes the shielded SIMS installation and presents a selection of results from the commissioning tests.|
|JRC Institute:||Institute for Transuranium Elements|
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