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|Title:||Full-Field Optical Coherence Tomography With a Complimentary Metal-Oxide Semiconductor Digital Signal Processor Camera|
|Authors:||EGAN Patrick; LAKESTANI FEREYDOUN; WHELAN MAURICE; CONNELLY Michael J.|
|Citation:||OPTICAL ENGINEERING vol. 45 no. 1 p. 1-6|
|Type:||Articles in periodicals and books|
|Abstract:||Full-field optical coherence tomography OCT using acomplementary metal-oxide semiconductor (CMOS) camera with an integrated a digital signal processor (DSP) is demonstrated. The CMOS-DSP camera employed is typically used in machine vision applications and is based on an array of direct readout pixels that are randomly addressable in space and time. These characteristics enable the camera to be used as a fast full-field detector in carrier-based optical metrology systems. Measurements are carried out on a simple calibration specimen indicated lateral and axial resolutions of 14 and 22 micro-metres, respectively.|
|JRC Institute:||Institute for Health and Consumer Protection Historical Collection|
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