Title: Full-Field Phase Measurement by Wavelength-Tuning Interferometry in the C-Band
Authors: EGAN PatrickLAKESTANI FEREYDOUNWHELAN MAURICECONNELLY Michael J.
Citation: OPTICAL ENGINEERING vol. 45 no. 12 p. 120504-1 - 120504-3
Publisher: SPIE-INT SOCIETY OPTICAL ENGINEERING
Publication Year: 2006
JRC N°: JRC36250
URI: http://publications.jrc.ec.europa.eu/repository/handle/JRC36250
Type: Articles in Journals
Abstract: Fluctuations in the output intensity and wavelength of an external cavity diode laser can introduce significant error to wavelength-tuned interferometric measurement. However, a robust phase-retrieval algorithm can compensate for these nonlinearities. Employing an inexpensive phosphor-coated charge-coupled device camera sensitive to C-band infrared, full-field interferometric phase retrieval utilizing wavelength tuning of a 1555 nm external cavity diode laser is reported. Phase measurement of a tilted mirror is presented with an estimated accuracy within 7 nm.
JRC Institute:Institute for Health and Consumer Protection

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