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|Title:||Full-Field Phase Measurement by Wavelength-Tuning Interferometry in the C-Band|
|Authors:||EGAN Patrick; LAKESTANI FEREYDOUN; WHELAN MAURICE; CONNELLY Michael J.|
|Citation:||OPTICAL ENGINEERING vol. 45 no. 12 p. 120504-1 - 120504-3|
|Publisher:||SPIE-INT SOCIETY OPTICAL ENGINEERING|
|JRC Publication N°:||JRC36250|
|Type:||Articles in Journals|
|Abstract:||Fluctuations in the output intensity and wavelength of an external cavity diode laser can introduce significant error to wavelength-tuned interferometric measurement. However, a robust phase-retrieval algorithm can compensate for these nonlinearities. Employing an inexpensive phosphor-coated charge-coupled device camera sensitive to C-band infrared, full-field interferometric phase retrieval utilizing wavelength tuning of a 1555 nm external cavity diode laser is reported. Phase measurement of a tilted mirror is presented with an estimated accuracy within 7 nm.|
|JRC Institute:||Institute for Health and Consumer Protection|
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