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|Title:||Low-level Gamma-ray Spectrometry Using Ge Detectors|
|Citation:||METROLOGIA vol. 44 p. S87-S94|
|Publisher:||BUREAU INT POIDS MESURES|
|Type:||Articles in Journals|
|Abstract:||The technological advances that have taken place recently in the fabrication of germanium-crystals have had a significant impact on low-level gamma-ray spectrometry. Use of large area crystals results in high detection efficiencies, which can serve to reduce detection limits or to make faster measurements of low activity samples possible. The second major development that has contributed to lowering detection limits has been research on identifying and reducing the background components in gamma-ray spectrometry systems. This paper deals with the major technical factors affecting performance of low-background HPGE-detectors and provides an overview of the major areas of application.|
|JRC Institute:||Institute for Reference Materials and Measurements|
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