Title: Random Depth Access Full-field Low-coherence Interferometry Applied to a Small Punch Test
Authors: EGAN PatrickWHELAN MAURICELAKESTANI FEREYDOUNCONNELLY M.j.
Citation: OPTICS AND LASERS IN ENGINEERING no. 45 p. 523-529
Publisher: ELSEVIER SCI LTD
Publication Year: 2007
JRC N°: JRC42020
ISSN: 0143-8166
URI: http://publications.jrc.ec.europa.eu/repository/handle/JRC42020
DOI: 10.1016/j.optlaseng.2006.10.005
Type: Articles in Journals
Abstract: In small punch testing, with approximate preknowledge of the sample deformation, profile measurement need only be made at selected locations in depth. To date, profilometry through full-field low-coherence interferometry has not been applied to small punch testing¿ conventional methods typically measure the maximum displacement as the sample is deformed, ignoring useful shape and profile information. A modification of full-field low-coherence interferometry is presented, where a digital stepper motor is combined with piezoelectric transducer scanning to achieve random depth access three-dimensional micrometer profile measurement. Offering a rapid, inexpensive, and functional machine vision system, the measurement technique is applied to a small punch test. r 2006 Elsevier Ltd. All rights reserved.
JRC Institute:Institute for Health and Consumer Protection

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