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|Title:||Random Depth Access Full-field Low-coherence Interferometry Applied to a Small Punch Test|
|Authors:||EGAN Patrick; WHELAN MAURICE; LAKESTANI FEREYDOUN; CONNELLY M.j.|
|Citation:||OPTICS AND LASERS IN ENGINEERING no. 45 p. 523-529|
|Publisher:||ELSEVIER SCI LTD|
|Type:||Articles in Journals|
|Abstract:||In small punch testing, with approximate preknowledge of the sample deformation, profile measurement need only be made at selected locations in depth. To date, profilometry through full-field low-coherence interferometry has not been applied to small punch testing¿ conventional methods typically measure the maximum displacement as the sample is deformed, ignoring useful shape and profile information. A modification of full-field low-coherence interferometry is presented, where a digital stepper motor is combined with piezoelectric transducer scanning to achieve random depth access three-dimensional micrometer profile measurement. Offering a rapid, inexpensive, and functional machine vision system, the measurement technique is applied to a small punch test. r 2006 Elsevier Ltd. All rights reserved.|
|JRC Institute:||Institute for Health and Consumer Protection|
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