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|Title:||Accelerated Ageing of Seven Different Thin-Film Module Types by Sequential Exposure to Damp Heat or Damp Heat with either Additional Applied Voltage or Ultraviolet Light|
|Authors:||SAMPLE Tony; SKOCZEK Artur; FIELD Michael; KOHL Michael; GEYER Dieter; HERRMANN Werner|
|Citation:||Proceedings of the 24th European Photovoltaic Solar Energy Conference p. 3241-3247|
|JRC Publication N°:||JRC50335|
|Type:||Contributions to Conferences|
|Abstract:||ABSTRACT: In this paper we have investigated the accelerated ageing of seven different thin-film module types through the use of sequential damp heat (85oC/85% RH) or damp heat tests with additional stress factors such as applied voltage or ultraviolet light. The module types [a-Si, tandem a-Si/a-Si micro-morph a-Si/µ-Si, triple junction a-Si, CIS (x2) and CdTe] were selected to cover a range of thin-film devices, materials and construction types. Sequential damp heat tests for cumulative exposure times of 250, 1000, 2000, 3000 and 4000h have been achieved to date, with the modules subjected to visual inspection, electrical insulation measurements and electrical performance measurements (IV curves). A wide range of performance losses (Pmax), from practically zero to -88%, were evident for the different technologies. The damp heat tests with applied voltage provoked very fast (<500h) degradation of some modules, with the critical factor being the use of glass in the module construction rather than the semi-conductor type of thin-film technology. Initial exposure, up to 500h, to a combined ultraviolet light and damp heat test has yet to provoke any significant damage. Sequential damp heat exposure tests can be used to induce accelerated aging on thin-film modules. However, it is not possible to equate loss of power to a number of years of outdoor exposure due to the lack of knowledge of the acceleration factors for each PV module type.|
|JRC Institute:||Institute for Energy and Transport|
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