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|Title:||Photoelectron Spectroscopy Study of PuCoGa5 Thin Films|
|Authors:||ELOIRDI Rachel; HAVELA L.; GOUDER Thomas; SHICK A. B.; REBIZANT J.; HUBER Frank; CACIUFFO Roberto|
|Citation:||JOURNAL OF NUCLEAR MATERIALS vol. 385 p. 8-10|
|Publisher:||ELSEVIER SCIENCE BV|
|Type:||Articles in periodicals and books|
|Abstract:||Thin layers of PuCoGax (x = 4 to 18) have been prepared by dc sputtering from a PuCoGa5 single crystal target, and investigated in situ by X-ray and ultraviolet photoelectron spectroscopy. We could achieve broad composition variability (monitored by the Pu-4f, Co-2p and Ga-2p core-level spectra). The results are compared to the valence band spectra reported previously for PuCoGa5. Our experiments reveal that some Ga excess (PuCoGa7) was likely for those original data. We demonstrate that there is a tendency to the segregation of Ga at the surface, which has an important effect on the valence band spectra.|
|JRC Institute:||Nuclear Safety and Security|
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