Title: Photoelectron Spectroscopy Study of PuCoGa5 Thin Films
Authors: ELOIRDI RachelHAVELA L.GOUDER ThomasSHICK A. B.REBIZANT J.HUBER FrankCACIUFFO Roberto
Citation: JOURNAL OF NUCLEAR MATERIALS vol. 385 p. 8-10
Publisher: ELSEVIER SCIENCE BV
Publication Year: 2009
JRC Publication N°: JRC50735
ISSN: 0022-3115
URI: http://www.elsevier.com/locate/jnucmat
http://publications.jrc.ec.europa.eu/repository/handle/JRC50735
DOI: 10.1016/j.jnucmat.2008.08.059
Type: Contributions to Conferences
Abstract: Thin layers of PuCoGax (x = 4 to 18) have been prepared by dc sputtering from a PuCoGa5 single crystal target, and investigated in situ by X-ray and ultraviolet photoelectron spectroscopy. We could achieve broad composition variability (monitored by the Pu-4f, Co-2p and Ga-2p core-level spectra). The results are compared to the valence band spectra reported previously for PuCoGa5. Our experiments reveal that some Ga excess (PuCoGa7) was likely for those original data. We demonstrate that there is a tendency to the segregation of Ga at the surface, which has an important effect on the valence band spectra.
JRC Institute:Institute for Transuranium Elements

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