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|Title:||Crystal Growth of CsCl-type Yb0.24Sn0.76Ru|
|Authors:||KLIMCZUK TOMASZ; WANG C. H.; XU Q.; LAWRENCE J.; DURAKIEWICZ T.; RONNING F.; LOBET A.; BAUER E.d.; GRIVEAU Jean-Christophe; SADOWSKI W.; ZANDBERGEN H.w; THOMPSON J.d.; CAVA R. J.|
|Citation:||JOURNAL OF CRYSTAL GROWTH vol. 318 no. 1 p. 1005 - 1008|
|Publisher:||ELSEVIER SCIENCE BV|
|Type:||Articles in periodicals and books|
|Abstract:||The Yb-Ru-Sn ternary system was investigated and a new material, Yb0.24Sn0.76Ru, with a simple cubic crystal structure, was discovered. Yb0.24Sn0.76Ru has a smaller lattice parameter a = 3.217(4) Å, than its isostructural YbRu analogue (a = 3.360 Å). Both x-ray diffraction and electron microscopy techniques were used to refine the crystal structure of Yb0.24Sn0.76Ru. It was found that a new compound forms in the CsCl structure, with Ru on the 1a site and a (Yb, Sn) mixture on site 1b. The xrd Rietveld analysis provides the occupation of Yb equal to 0.24, in agreement with the single crystal nano-electron diffraction refinement, which gives the occupation 0.21.|
|JRC Institute:||Nuclear Safety and Security|
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