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|Title:||Occupation Preferences in Doped CmIm' Multinaries by Correlated Analysis of EXAFS and FTIR Data|
|Authors:||ROBOUCH B.v.; MARCELLI A.; ROBOUCH Piotr; KISIEL Andrej|
|Citation:||LOW TEMPERATURE PHYSICS vol. 37 no. 3 p. 241-244|
|Publisher:||AMER INST PHYSICS|
|Type:||Articles in periodicals and books|
|Abstract:||We discuss x-ray absorption fine structure (EXAFS) data for binary doped CmIm' compound structures which can be deconvolved to determine elemental bond distances and the deviations from random configurations owing to site preference occupations (SOPs). The SOP-deviation estimates can be confirmed further by independent Fourier transform infrared (FTIR) data. The limits of our model are discussed.|
|JRC Directorate:||Health, Consumers and Reference Materials|
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