Title: Occupation Preferences in Doped CmIm' Multinaries by Correlated Analysis of EXAFS and FTIR Data
Authors: ROBOUCH B.v.MARCELLI A.ROBOUCH PiotrKISIEL Andrej
Citation: LOW TEMPERATURE PHYSICS vol. 37 no. 3 p. 241-244
Publisher: AMER INST PHYSICS
Publication Year: 2011
JRC N°: JRC65034
ISSN: 1063-777X
URI: http://publications.jrc.ec.europa.eu/repository/handle/JRC65034
DOI: 10.1063/1.3570929
Type: Articles in Journals
Abstract: We discuss x-ray absorption fine structure (EXAFS) data for binary doped CmIm' compound structures which can be deconvolved to determine elemental bond distances and the deviations from random configurations owing to site preference occupations (SOPs). The SOP-deviation estimates can be confirmed further by independent Fourier transform infrared (FTIR) data. The limits of our model are discussed.
JRC Institute:Institute for Reference Materials and Measurements

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