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|Title:||The Scherrer equation versus the ‘Debye–Scherrer equation’|
|Authors:||GIBSON Peter; HOLZWARTH Uwe|
|Citation:||NATURE NANOTECHNOLOGY vol. 6 no. 9 p. 534|
|Publisher:||NATURE PUBLISHING GROUP|
|Type:||Articles in periodicals and books|
|Abstract:||X-ray diffraction on crystalline powders offers a convenient method for determining the mean size of single crystal nanoparticles or nanograins in nanocrystalline bulk materials. The first to investigate the effect of limited particle size, and hence limited number of lattice planes contributing to diffraction, on the width of x-ray diffraction peaks was Paul Scherrer who published his results in 19181 in a paper that included what became known as Scherrer’s formula (or Scherrer’s equation). This still represents the most useful x-ray method for determining average particle or grain size Dhkl perpendicular to the analyzed lattice planes with the Miller indices (hkl).|
|JRC Institute:||Institute for Health and Consumer Protection|
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