Title: Measurement of the 230U half-life
Authors: POMME StefaanALTZITZOGLOU TimotheosVAN AMMEL RafSULIMAN GABRIELMAROULI MARIAJOBBAGY VIKTORPAEPEN JanSTROH HEIKOAPOSTOLIDIS ChristosABBAS KamelMORGENSTERN Alfred
Citation: APPLIED RADIATION AND ISOTOPES vol. 70 no. 9 p. 1900-1906
Publisher: PERGAMON-ELSEVIER SCIENCE LTD
Publication Year: 2012
JRC N°: JRC66156
ISSN: 0969-8043
URI: http://publications.jrc.ec.europa.eu/repository/handle/JRC66156
DOI: 10.1016/j.apradiso.2012.02.053
Type: Contributions to Conferences
Abstract: The 230U half-life was determined by measuring the decay curve of 230U sources by various nuclear detection techniques: alpha-particle counting at a defined small solid angle; 4pi alpha+beta counting with a windowless CsI sandwich spectrometer, a liquid scintillation counter and a pressurised proportional counter; gamma-ray spectrometry with a HPGe detector and nearly-2pi alpha-particle counting with an ion-implanted silicon detector. Depending on the technique, the decay was followed for100-200 d, which is 5-10 times the 230U half-life. The measurement results of the various techniques were in good mutual agreement. The mean value, T1/2(230U)=20.23 (2) d, is lower than the literature value which is based on one measurement in 1948 and resulted in a half-life value of 20.8 d without statement of uncertainty. A correction for the ingrowth of the long-lived 210Pb and its daughter products may have been overlooked in the past.
JRC Institute:Institute for Reference Materials and Measurements

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