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|Title:||Measurement of the 230U half-life|
|Authors:||POMME Stefaan; ALTZITZOGLOU Timotheos; VAN AMMEL Raf; SULIMAN GABRIEL; MAROULI MARIA; JOBBAGY VIKTOR; PAEPEN Jan; STROH HEIKO; APOSTOLIDIS Christos; ABBAS Kamel; MORGENSTERN Alfred|
|Citation:||APPLIED RADIATION AND ISOTOPES vol. 70 no. 9 p. 1900-1906|
|Publisher:||PERGAMON-ELSEVIER SCIENCE LTD|
|Type:||Articles in periodicals and books|
|Abstract:||The 230U half-life was determined by measuring the decay curve of 230U sources by various nuclear detection techniques: alpha-particle counting at a defined small solid angle; 4pi alpha+beta counting with a windowless CsI sandwich spectrometer, a liquid scintillation counter and a pressurised proportional counter; gamma-ray spectrometry with a HPGe detector and nearly-2pi alpha-particle counting with an ion-implanted silicon detector. Depending on the technique, the decay was followed for100-200 d, which is 5-10 times the 230U half-life. The measurement results of the various techniques were in good mutual agreement. The mean value, T1/2(230U)=20.23 (2) d, is lower than the literature value which is based on one measurement in 1948 and resulted in a half-life value of 20.8 d without statement of uncertainty. A correction for the ingrowth of the long-lived 210Pb and its daughter products may have been overlooked in the past.|
|JRC Institute:||Institute for Reference Materials and Measurements|
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