Title: Versailles Project on Advanced Materials and Standards Interlaboratory Study on Measuring the Thickness and Chemistry of Nanoparticle Coatings Using XPS and LEIS
Authors: BELSEY NatalieCANT DavidMINELLI CaterinaARUJO JoyceBOCK BerndBRUNER PhilippeCASTNER DavidCECCONE GiacomoCOUNSELL JonathanDIETRICH Paul MENGELHARD, Mark H.FEARN, SarahGALHARDO Carlos E.KALBE, HenrykKIM Jeong WonLARTUNDO-ROJAS LuisLUFTMAN Henry S.NUNNEY Tim S.PSEINER JohannesSMITH Emily F.SPAMPINATO VALENTINASTURM Jacobus M.THOMAS, Andrew G.TREACY, Jon P.w.VEITH, LotharWAGSTAFFE, MichaelWANG HaiWANG MeilingWANG Yung-ChenWERNER, WolfgangYANG, LiSHARD Alexander
Citation: JOURNAL OF PHYSICAL CHEMISTRY C vol. 120 no. 42 p. 24070−24079
Publisher: AMER CHEMICAL SOC
Publication Year: 2016
JRC N°: JRC104239
ISSN: 1932-7447
URI: http://publications.jrc.ec.europa.eu/repository/handle/JRC104239
DOI: 10.1021/acs.jpcc.6b06713
Type: Articles in periodicals and books
Abstract: We report the results of a Versailles Project on Advanced Materials and Standards (VAMAS) interlaboratory study on the measurement of the shell thickness and chemistry of nanoparticle coatings. Peptide-coated gold particles were supplied to laboratories in two forms: a colloidal suspension in pure water and particles dried onto a silicon wafer. Participants prepared and analyzed these samples using either X-ray photoelectron spectroscopy (XPS) or low energy ion scattering (LEIS). Careful data analysis revealed some significant sources of discrepancy, particularly for XPS. Degradation during transportation, storage, or sample preparation resulted in a variability in thickness of 53%. The calculation method chosen by XPS participants contributed a variability of 67%. However, variability of 12% was achieved for the samples deposited using a single method and by choosing photoelectron peaks that were not adversely affected by instrumental transmission effects. The study identified a need for more consistency in instrumental transmission functions and relative sensitivity factors since this contributed a variability of 33%. The results from the LEIS participants were more consistent, with variability of less than 10% in thickness, and this is mostly due to a common method of data analysis. The calculation was performed using a model developed for uniform, flat films, and some participants employed a correction factor to account for the sample geometry, which appears warranted based upon a simulation of LEIS data from one of the participants and comparison to the XPS results.
JRC Directorate:Health, Consumers and Reference Materials

Files in This Item:
There are no files associated with this item.


Items in repository are protected by copyright, with all rights reserved, unless otherwise indicated.