Preparation and characterization of 33S samples for 33S(n,α)30Si cross-section measurements at the n_TOF facility at CERN

Please use this identifier to cite or link to this item: http://publications.jrc.ec.europa.eu/repository/handle/JRC112499

Title:	Preparation and characterization of 33S samples for 33S(n,α)30Si cross-section measurements at the n_TOF facility at CERN
Authors:	PRAENA J.; FERRER F. J.; VOLLENBERG W.; SABATE-GILARTE M; FERNANDEZ B.; GARCIA-LOPEZ J.; PORRAS I.; QUESADA J.; ALTSTADT S.; ANDRZEJEWSKI J.; AUDOUIN L.; BECARES V.; BARBAGALLO M.; BECVÁR F.; BELLONI F.; BERTHOUMIEUX E.; BILLOWES J.; BOCCONE V.; BOSNAR D.; BRUGGER M.; CALVIÑO F.; CALVIANI M.; CANO-OTT D.; CARRAPICO C.; CERUTTI F.; CHIAVERI E.; CHIN M.; COLONNA N.; CORTES G.; CORTES-GIRALDO M. A.; DIAKAKI M.; DIETZ M.; DOMINGO-PARDO C.; DRESSLER R.; DURAN I.; ELEFTHERIADIS C.; FERRARI A.; FRAVAL K.; FURMAN V.; GÖBEL K.; GOMEZ-HORNILLOS M. B.; GANESAN S.; GARCIA A. R.; GIUBRONE G.; GONCALVES I.; GONZALEZ-ROMERO E.; GOVERDOVSKI A.; GRIESMAYER E.; GUERRERO C.; GUNSING F.; HEFTRICH T.; HERNANDEZ-PRIETO A.; HEYSE JAN; JENKINS D. G.; JERICHA E.; KAEPPELER F.; KADI Y.; KARADIMOS D.; KATABUCHI T.; KETLEROV V.; KHRYACHKOV VITALI; KIVEL NIKO; KOEHLER P.; KOKKORIS M.; KROLL J.; KRTIČKA M.; LAMPOUDIS C.; LANGER C.; LEAL-CIDONCHA E.; LEDERER C.; LEEB H.; LEONG L. S.; LERENDEGUI-MARCO J.; LOSITO R.; MALLICK A.; MANOUSOS A; MARGANIEC J.; MARTÍNEZ T.; MASSIMI C.; MASTINU P.; MASTROMARCO M.; MENDOZA E.; MENGONI A.; MILAZZO P. M.; MINGRONE F.; MIREA M.; MONDELAERS WILLY; PARADELA C.; PAVLIK ANDREAS; PERKOWSKI J.; PLOMPEN ARJAN; RAUSCHER T.; REIFARTH R.; RIEGO A.; ROBLES M. S.; RUBBIA C.; RUBBIA C.; RYAN J.; SARMENTO R.; SAXENA A.; SCHILLEBEECKX PETER; SCHMIDT S.; SCHUMANN D.; SEDYSHEV P.; TAGLIENTE G.; TAIN J. L.; TARIFENO-SALDIVIA A.; TARRIO D.; TASSAN-GOT L.; TSINGANIS A.; VALENTA S.; VANNINI G.; VARIALE V.; VAZ P.; VENTURA A.; VERMEULEN J.; VLACHOUDIS V.; VLASTOU R.; WALLNER A.; WARE T.; WEIGAND M.; WEISS C.; WRIGHT T. J.; ZUGEC P.
Citation:	NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT vol. 890 p. 142-147
Publisher:	ELSEVIER SCIENCE BV
Publication Year:	2018
JRC N°:	JRC112499
ISSN:	0168-9002 (online)
URI:	http://publications.jrc.ec.europa.eu/repository/handle/JRC112499
DOI:	10.1016/j.nima.2018.02.055
Type:	Articles in periodicals and books
Abstract:	Thin 33S samples for the study of the 33S(n,α)30Si cross-section at the n_TOF facility at CERN were made by thermal evaporation of 33S powder onto a dedicated substrate made of kapton covered with thin layers of copper, chromium and titanium. This method has provided for the first time bare sulfur samples a few centimeters in diameter. The samples have shown an excellent adherence with no mass loss after few years and no sublimation in vacuum at room temperature. The determination of the mass thickness of 33S has been performed by means of Rutherford backscattering spectrometry. The samples have been successfully tested under neutron irradiation.
JRC Directorate:	Nuclear Safety and Security

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