TEM-EELS analyses of protactinium
A fragment of metallic protactinium (Pa) has been studied using a transmission electron microscope (TEM) equipped with an electron energy loss spectroscopy (EELS) detector. Bright and dark field TEM images have been acquired, and selective area electron diffraction (SAED) has been used to study the crystal structures. The results showed the presence of domains both of metallic and of oxidized material that likely occurred during sample preparation. EELS edges have been collected for the first time for the oxide compounds and compared with those computed using many-electron atomic spectral methods.
DIESTE BLANCO Oliver;
WISS Thierry;
GRIVEAU Jean-Christophe;
KONINGS Rudy;
VAN DER LAAN Gerrit;
CACIUFFO Roberto;
2018-12-11
IOP PUBLISHING LTD
JRC113665
2053-1591 (online),
https://publications.jrc.ec.europa.eu/repository/handle/JRC113665,
10.1088/2053-1591/aaef23 (online),
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