High Pressure X-Ray Diffraction Studies of UX3 (X =  Al, Si, Ga, Ge, In, Sn)

LE, BIHAN Tristan; DARRACQ, Stephane; ABRAHAM, Hans Christian; WINAND, Jean Marc; BENEDICT, Ulrich Gottfried

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High Pressure X-Ray Diffraction Studies of UX3 (X = Al, Si, Ga, Ge, In, Sn)

Several intermetallic uranium compounds UX3 (X = Al, Si, Ga, Ge, In, Sn) were studied under high pressure up to ca. 40 GPa (except UGa3 up to 80 GPa) using a diamond anvil cell and energy dispersive X-ray diffraction facilities. The compounds which have the cubic AuCu3 structure, do not show any crystallographic phase transition in the domain of investigation.

LE BIHAN Tristan; DARRACQ Stephane; ABRAHAM Hans Christian; WINAND Jean Marc; BENEDICT Ulrich Gottfried;

1996-08-08

JRC12650

https://publications.jrc.ec.europa.eu/repository/handle/JRC12650,

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