In order to better understand the mechanisms of damage creation in nuclear fuels, 3mm diam. UO2 disks were implanted with 173 MeV Xe ions with fluences varying between 7.10x10 and 6.10x14 ions.cm-2. Come of these disks were analysed by TEM and SEM. Cross-sectional SEM of a UO2 sample implanted at the highest fluence revealed the Xe-rich zone to be located at a depth of 9.5 +-0.56 um. This is in good agreement with the calculated Xe-distribution profile and the displacement distribution produced by the Xe ions in UO2 and is, at the same time, a confirmation of the TRIM code at these high energies.
MATZKE Hj.;
WISS Thierry;
1996-08-09
JRC13184
https://publications.jrc.ec.europa.eu/repository/handle/JRC13184,
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