Title: Estimation of the 2D Measurement Error Introduced by In-Plane and Out-of-Plane Electronic Speckle Pattern Interferometry Instruments.
Authors: ALBRECHT Daniel jacques
Citation: Optics and Lasers in Engineering vol. 31 p. 63-81
Publication Year: 1999
JRC N°: JRC16343
URI: http://publications.jrc.ec.europa.eu/repository/handle/JRC16343
Type: Articles in periodicals and books
Abstract: Optical interferometic metrology techniques are being increasingly used in industry.These techniques assure a greater accuracy in measuring displacements caused by deformations. One such technique, Electronic Speckle Pattern Interferometry (ESPI), has been used successfully to measure out-of-plane deformations. This study has lead to an improved 3D geometric model, allowing us to assess qualitatively and quantitatively what is actually measured throughout all the inspected surface. Calculations with practical parameters taken from a real ESPI instrument designed in the Joint Research Centre of Ispra (Italy) were carried out. The results showing three-dimensional diagrams of the error measurements are presented and discussed.
JRC Directorate:Joint Research Centre Historical Collection

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