Title: Application of Secondary Ion Mass Spectrometry for the Characterisation of Microparticles.
Authors: TAMBORINI GabriellaBETTI Maria
Citation: Mikrochimica Acta vol. 132 p. 411-417
Publication Year: 2000
JRC N°: JRC18744
URI: http://publications.jrc.ec.europa.eu/repository/handle/JRC18744
Type: Articles in periodicals and books
Abstract: Abstract not available
JRC Directorate:Nuclear Safety and Security

Files in This Item:
There are no files associated with this item.

Items in repository are protected by copyright, with all rights reserved, unless otherwise indicated.