X-Ray Photoelectron Spectroscopy on Uranium Oxides. A Comparison between Bulk and Thin Layers.

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Abstract not available

VAN DEN BERGHE S.; MISERQUE F.; GOUDER Thomas; GAUDREAU B.; VERWERFT Marc;

2001-06-01

JRC21705

https://publications.jrc.ec.europa.eu/repository/handle/JRC21705,

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