Resonant and Nonresonant Laser Ionization of Sputtered Uranium Atoms from Thin Films and Single Microparticles. Evaluation of a Combined System for Particle and Trace Analysis.
Abstract not available
ERDMANN N.;
BETTI Maria;
KOLLMER F.;
BENNINGHOVEN A.;
GRUENING C.;
PHILIPSEN V.;
LIEVENS P.;
SILVERANS R.E.;
VANDEWEERT E.;
2003-01-08
JRC24414
https://publications.jrc.ec.europa.eu/repository/handle/JRC24414,
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