Full-Field Phase Measurement by Wavelength-Tuning Interferometry in the C-Band
Fluctuations in the output intensity and wavelength
of an external cavity diode laser can introduce significant
error to wavelength-tuned interferometric measurement.
However, a robust phase-retrieval algorithm can
compensate for these nonlinearities. Employing an inexpensive
phosphor-coated charge-coupled device camera sensitive
to C-band infrared, full-field interferometric phase retrieval
utilizing wavelength tuning of a 1555 nm external
cavity diode laser is reported. Phase measurement of a tilted
mirror is presented with an estimated accuracy within 7 nm.
EGAN Patrick;
LAKESTANI Fereydoun;
WHELAN Maurice;
CONNELLY Michael J.;
2007-02-13
SPIE-INT SOCIETY OPTICAL ENGINEERING
JRC36250
https://publications.jrc.ec.europa.eu/repository/handle/JRC36250,
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