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dc.contributor.authorEGAN Patricken_GB
dc.contributor.authorLAKESTANI FEREYDOUNen_GB
dc.contributor.authorWHELAN MAURICEen_GB
dc.contributor.authorCONNELLY Michael J.en_GB
dc.date.accessioned2010-02-25T14:41:51Z-
dc.date.available2007-02-13en_GB
dc.date.available2010-02-25T14:41:51Z-
dc.date.issued2006en_GB
dc.date.submitted2007-01-26en_GB
dc.identifier.citationOPTICAL ENGINEERING vol. 45 no. 12 p. 120504-1 - 120504-3en_GB
dc.identifier.urihttp://publications.jrc.ec.europa.eu/repository/handle/JRC36250-
dc.description.abstractFluctuations in the output intensity and wavelength of an external cavity diode laser can introduce significant error to wavelength-tuned interferometric measurement. However, a robust phase-retrieval algorithm can compensate for these nonlinearities. Employing an inexpensive phosphor-coated charge-coupled device camera sensitive to C-band infrared, full-field interferometric phase retrieval utilizing wavelength tuning of a 1555 nm external cavity diode laser is reported. Phase measurement of a tilted mirror is presented with an estimated accuracy within 7 nm.en_GB
dc.description.sponsorshipJRC.I.4-Nanotechnology and Molecular Imagingen_GB
dc.format.mediumPrinteden_GB
dc.languageENGen_GB
dc.publisherSPIE-INT SOCIETY OPTICAL ENGINEERINGen_GB
dc.relation.ispartofseriesJRC36250en_GB
dc.titleFull-Field Phase Measurement by Wavelength-Tuning Interferometry in the C-Banden_GB
dc.typeArticles in periodicals and booksen_GB
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