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http://publications.jrc.ec.europa.eu/repository/handle/JRC36250| Title: | Full-Field Phase Measurement by Wavelength-Tuning Interferometry in the C-Band |
| Authors: | EGAN Patrick; LAKESTANI FEREYDOUN; WHELAN MAURICE; CONNELLY Michael J. |
| Citation: | OPTICAL ENGINEERING vol. 45 no. 12 p. 120504-1 - 120504-3 |
| Publisher: | SPIE-INT SOCIETY OPTICAL ENGINEERING |
| Publication Year: | 2006 |
| JRC N°: | JRC36250 |
| URI: | http://publications.jrc.ec.europa.eu/repository/handle/JRC36250 |
| Type: | Articles in periodicals and books |
| Abstract: | Fluctuations in the output intensity and wavelength of an external cavity diode laser can introduce significant error to wavelength-tuned interferometric measurement. However, a robust phase-retrieval algorithm can compensate for these nonlinearities. Employing an inexpensive phosphor-coated charge-coupled device camera sensitive to C-band infrared, full-field interferometric phase retrieval utilizing wavelength tuning of a 1555 nm external cavity diode laser is reported. Phase measurement of a tilted mirror is presented with an estimated accuracy within 7 nm. |
| JRC Directorate: | Institute for Health and Consumer Protection Historical Collection |
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