Please use this identifier to cite or link to this item:
|Title:||Applicability of the Bilinear I-V Curves Translation Method for Indoor Characterization of Thin Film Devices|
|Authors:||SKOCZEK ARTUR; NIKOLAEVA-DIMITROVA MIGLENA; DUNLOP EWAN|
|Citation:||Proceedings of NUMOS, International workshop on Numerical Modelling of Thin Film Solar Cells vol. 1 p. 221-226|
|Type:||Articles in periodicals and books|
|Abstract:||The paper presents an application of bilinear interpolation/extrapolation I-V curve translation method for reconstruction of indoor temperature and irradiance matrixes of thin film devices. A full PV device matrix is routine measurement carried out at the ESTI laboratory in a broad range of temperatures (from 25C to 60C) and irradiances (from 50 W/m2 to 1000 W/m2) allowing to obtain “performance surface” of given PV device. The advantage of the bilinear curve translation method is a possibility of estimation of all basic electrical parameters of the device. The accuracy of the method was investigated for both interpolated and extrapolated curves at different values of temperature and irradiance. In order to improve quality of translation procedure additional temperature correction was applied to the Isc. The results indicate good accuracy of the translation procedure not only for interpolated but also for extrapolated curves of different thin film devices if only initial values of irradiance and temperature were distinct enough.|
|JRC Directorate:||Sustainable Resources|
Files in This Item:
There are no files associated with this item.
Items in repository are protected by copyright, with all rights reserved, unless otherwise indicated.