Random Depth Access Full-field Low-coherence Interferometry Applied to a Small Punch Test
In small punch testing, with approximate preknowledge of the sample deformation, profile measurement need only be made at selected
locations in depth. To date, profilometry through full-field low-coherence interferometry has not been applied to small punch testing¿
conventional methods typically measure the maximum displacement as the sample is deformed, ignoring useful shape and profile
information. A modification of full-field low-coherence interferometry is presented, where a digital stepper motor is combined with
piezoelectric transducer scanning to achieve random depth access three-dimensional micrometer profile measurement. Offering a rapid,
inexpensive, and functional machine vision system, the measurement technique is applied to a small punch test.
r 2006 Elsevier Ltd. All rights reserved.
EGAN Patrick;
WHELAN Maurice;
LAKESTANI Fereydoun;
CONNELLY M.J.;
2008-01-09
ELSEVIER SCI LTD
JRC42020
0143-8166,
https://publications.jrc.ec.europa.eu/repository/handle/JRC42020,
10.1016/j.optlaseng.2006.10.005,
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