In this paper we have investigated the accelerated ageing of seven different thin-film module types through the use of sequential damp heat (85oC/85% RH) tests. The module types [a-Si, tandem a-Si/a-Si micro-morph a-Si/µ-Si, triple junction a-Si, CIS (x2) and CdTe] were
selected to cover a range of thin-film devices, materials and construction types. Sequential damp heat tests for cumulative exposure times of 250, 1000, 2000 and 3000h have been achieved to date, with the modules subjected to visual inspection, electrical insulation measurements and electrical performance measurements (IV curves). A wide range of performance losses (Pmax), from almost zero
to -70%, were evident for the different technologies.
Sequential damp heat exposure tests can be used to induce accelerated aging on thin-film modules. However, it is not possible to equate loss of power to a number of years of outdoor exposure due to the lack of knowledge of the acceleration factors for each PV module type.
SAMPLE Tony;
SKOCZEK Artur;
FIELD Michael;
2010-02-09
IEEE
JRC50340
https://publications.jrc.ec.europa.eu/repository/handle/JRC50340,
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