Title: Standard Characterization of Multi-junction Thin-film Photovoltaic Modules - Spectral Mismatch Correction to Standard Test Conditions and Comparison with Outdoor Measurements
Citation: MRS Symposium Proceedings - Amorphous and Polycrystalline Thin-Film Silicon Science and Technology - ISBN 978-1-60511-222-0 vol. 1245
Publisher: Materials Research Society
Publication Year: 2010
JRC N°: JRC56600
URI: http://publications.jrc.ec.europa.eu/repository/handle/JRC56600
DOI: 10.1557/PROC-1245-A13-06
Type: Articles in periodicals and books
Abstract: Multi-junction thin-film devices have emerged as very promising PV materials due to reduced cost, manufacturing ease, efficiency and long term performance. The consequent growing interest of the PV community has lead to the development of new methods for the correction of indoor measurements to standard test conditions (STC), as presented in this paper. The experimental setup for spectral response measurement of multi-junction large-area thin-film modules is presented. A method for reliable corrections of indoor current-voltage characterization to STC is presented: results are compared with outdoor measurements where irradiance conditions are close to standard ones, highlighting ongoing challenges in standard characterization of such devices.
JRC Directorate:Energy, Transport and Climate

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