An Alternative Method for Spectral Response Measurements of Large-area Thin Film Photovoltaic Modules

Abstract

A new method for the spectral response measurement of large‐area single and multi‐junction thin‐film photovoltaic modules is presented, making use of a chopped monochromatic beam produced from a continuous source with band pass filters and lock‐in technique. The beam is projected onto part of the test module and superimposed over continuous bias light of variable colour. The procedure for the determination of the absolute spectral response is presented, and the influence of the intrinsic non‐uniformity of the monochromatic beam is investigated. The results obtained are compared with those from two other methods of spectral response measurement, providing a validation of the proposed experimental setup.