Occupation Preferences in Doped CmIm' Multinaries by Correlated Analysis of EXAFS and FTIR Data

ROBOUCH, B.V.; MARCELLI, A.; ROBOUCH, Piotr; KISIEL, Andrej

doi:10.1063/1.3570929

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Occupation Preferences in Doped CmIm' Multinaries by Correlated Analysis of EXAFS and FTIR Data

We discuss x-ray absorption fine structure (EXAFS) data for binary doped CmIm' compound structures which can be deconvolved to determine elemental bond distances and the deviations from random configurations owing to site preference occupations (SOPs). The SOP-deviation estimates can be confirmed further by independent Fourier transform infrared (FTIR) data. The limits of our model are discussed.

ROBOUCH B.V.; MARCELLI A.; ROBOUCH Piotr; KISIEL Andrej;

2011-06-14

AMER INST PHYSICS

JRC65034

1063-777X,

https://publications.jrc.ec.europa.eu/repository/handle/JRC65034,

10.1063/1.3570929,

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