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dc.contributor.authorPEREZ ROLDAN Maria Jesusen_GB
dc.contributor.authorCOLPO Pascalen_GB
dc.contributor.authorCECCONE Giacomoen_GB
dc.contributor.authorGILLILAND Douglasen_GB
dc.contributor.authorROSSI Francoisen_GB
dc.date.accessioned2014-01-15T01:02:41Z-
dc.date.available2014-01-14en_GB
dc.date.available2014-01-15T01:02:41Z-
dc.date.created2014-01-09en_GB
dc.date.issued2012en_GB
dc.date.submitted2012-05-12en_GB
dc.identifier.citationSURFACE AND INTERFACE ANALYSIS vol. 45 no. 1 p. 240-243en_GB
dc.identifier.issn0142-2421en_GB
dc.identifier.urihttp://onlinelibrary.wiley.com/doi/10.1002/sia.5070/abstracten_GB
dc.identifier.urihttp://publications.jrc.ec.europa.eu/repository/handle/JRC71196-
dc.description.abstractIn this work we present a method to produce micro and nanostructured surfaces containing bioadhesive features embedded in an antifouling matrix. These surfaces are fabricated by combining plasma polymerization and electron beam lithography. This combination allows the fabrication of structured surfaces in just two steps and without the use of solvents. ToF-SIMS analysis demonstrates that the e-beam treatment induces a chemical change at the surface depending upon the radiation dose employed. In particular, a decrease of peaks characteristics of the PEO-like fragments, (e.g. CH3O+, C3H7O+, C3H5O2+) and a correspondent increase of hydrocarbon moieties such as C2H3+ and C3H3+ is observed in the irradiated zones. These results are supported by XPS analysis that indicate a slight reduction of the intensity of the C-O component in the C1s core level spectrum after irradiation similar to that observed in UV-treated PEO-like films. Experiments with proteins show a preferential adhesion of the biomolecules to the irradiated zone indicating the good potential of this technique for the development of nanostructured biosensing platforms.en_GB
dc.description.sponsorshipJRC.I.4-Nanobiosciencesen_GB
dc.format.mediumPrinteden_GB
dc.languageENGen_GB
dc.publisherWILEY-BLACKWELLen_GB
dc.relation.ispartofseriesJRC71196en_GB
dc.titleSurface Characterisation of PEO-like microstructures by means of ToF-SIMS, XPS and SPRen_GB
dc.typeArticles in periodicals and booksen_GB
dc.identifier.doi10.1002/sia.5070en_GB
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