Title: Thermal Recovery and Lattice Expansion of Self-Irradiated U0.80Am0.20O2-x, an in-situ High Temperature X-Ray Diffraction Study
Authors: PRIEUR DAMIENPAGLIOSA GiorgioSPINO JOSE LUISCACIUFFO RobertoSOMERS JosephELOIRDI Rachel
Citation: JOURNAL OF SOLID STATE CHEMISTRY vol. 199 no. March 2013 p. 334-337
Publisher: ACADEMIC PRESS INC ELSEVIER SCIENCE
Publication Year: 2013
JRC N°: JRC75862
ISSN: 0022-4596
URI: http://www.sciencedirect.com/science/article/pii/S0022459612007372
http://publications.jrc.ec.europa.eu/repository/handle/JRC75862
DOI: 10.1016/j.jssc.2012.12.022
Type: Articles in periodicals and books
Abstract: The thermal recovery of self-irradiated and damaged U0.80Am0.20O2−x solid solution was studied in situ using high-temperature x-ray diffraction between 25◦C and 1300◦C. The cumulative α decay doses of the damaged material was equal to 2.2 displacements per atom, leading to a lattice expansion of 0.31%. This value is close to the saturated lattice expansion of self-irradiated polycrystalline UO2 and AmO2. The thermal recovery process is characterized by three stages, as revealed by the temperature derivative of the lattice parameter showing showing two maxima at 600◦C and 1000◦C. The thermal recovery is completed at about 1200◦C. These data are compared with existing studies on other oxide fuels. In addition, the lattice expansion of the damaged U0.80Am0.20O2−x sample is also discussed and compared to defect free UO2, NpO2 and AmO2 materials. The thermal energy necessary to initiate the annealing of the defects is reached at about 400◦C, whilst at 1100◦C, a defect free U0.80Am0.20O2−x sample is obtained.
JRC Directorate:Nuclear Safety and Security

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