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|Title:||Decay data measurements on 213Bi using recoil atoms|
|Authors:||MAROULI MARIA; SULIMAN GABRIEL; POMME Stefaan; VAN AMMEL Raf; JOBBAGY VIKTOR; STROH HEIKO; DIKMEN H.; PAEPEN Jan; DIRICAN A.; BRUCHERTSEIFER Frank; APOSTOLIDIS Christos; MORGENSTERN Alfred|
|Citation:||APPLIED RADIATION AND ISOTOPES vol. 74 p. 123-127|
|Publisher:||PERGAMON-ELSEVIER SCIENCE LTD|
|Type:||Articles in periodicals and books|
|Abstract:||In this work, 213Bi has bee nseparated from a nopen 225Ac source by collecting recoil atoms onto a glass plate in vacuum. The activity of such recoil sources has been measured as a function of time, using an ion-implanted planar Si detector in quasi-2pi geometry. From these measurements, a new half-life value of T1/2(213Bi)=45.62 (6) min was derived.Additionally, high-resolution alpha-spectrometry measurements were performed at a solid angle of 0.4% of 4pi sr, to verify the energies and emission probabilities of the alpha-emissions from 213Bi. Using 225Ac, 221Fr, 217At and 213Po peaks as reference peaks, the measured 213Bi alpha-peak energies at Ealpha,0=5878 (4) keV and Ealpha,1=5560 (4) keV were about 10 keV higher than validated data. The relative alpha-particle emission probabilities of 213Bi, Palpha,0=0.9155 (11) and Palpha,1=0.0845 (11), and the 213Bi alpha branching factor, Palpha=1-Pbeta=2.140 (10)%, are compatible with recommended values, but have a higher accuracy.|
|JRC Directorate:||Health, Consumers and Reference Materials|
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