Alpha-particle emission probabilities of 236U obtained by alpha spectrometry

High-resolution alpha-particle spectrometry was performed with an ion-implanted silicon detector in vacuum on a homogeneously electrodeposited 236U source. The source was measured at different solid angles subtended by the detector, varying between 0.8% and 2.4% of 4π sr, to assess the influence of coincidental detection of alpha-particles and conversion electrons on the measured alpha-particle emission probabilities. Additional measurements were performed using a bending magnet to eliminate conversion electrons, the results of which coincide with normal measurements extrapolated to an infinitely small solid angle.The measured alpha emission probabilities for the three main peaks – 74.20 (5)%, 25.68(5)% and 0.123 (5)%, respectively – are consistent with literature data, but their precision has been improved by at least one order of magnitude in this work.

MAROULI Maria;  POMME Stefaan;  JOBBAGY Viktor;  VAN AMMEL Raf;  PAEPEN Jan;  STROH Heiko;  BENEDIK Ljudmila; 

2014-04-16

PERGAMON-ELSEVIER SCIENCE LTD

JRC80528

0969-8043,   

http://dx.doi.org/10.1016/j.apradiso.2013.11.020,    https://publications.jrc.ec.europa.eu/repository/handle/JRC80528,   

10.1016/j.apradiso.2013.11.020,