In the very near future, the vast majority of mobile phones will be NFC-enabled. The NFC technology, other than adding extra features to mobile devices, adds a new way for attackers to break into these. The aim of this paper is to draw the attention to one aspect related to the security of NFC devices, the NFC Data Exchange Format (NDEF). In this paper will be introduced techniques for testing NDEF, as well as to propose a new solution for fuzz testing NDEF on smart phones.
STIRPARO Pasquale;
2013-08-13
IEEE
JRC81862
978-0-7695-5042-8,
http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6571360,
https://publications.jrc.ec.europa.eu/repository/handle/JRC81862,
10.1109/CICSYN.2013.58,
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