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|Title:||Comparison of XRD, XANES and TGA methods to assess the O/M ratio of Th0.60Am0.40O2-x|
|Authors:||PRIEUR DAMIEN; VIGIER JEAN-FRANCOIS; ROTHE J.; SOMERS Joseph|
|Citation:||JOURNAL OF NUCLEAR MATERIALS vol. 448 no. 1-3 p. 4-7|
|Publisher:||ELSEVIER SCIENCE BV|
|Type:||Articles in periodicals and books|
|Abstract:||The mixed oxide Th0.60Am0.40O2-x has been synthesized and characterized after reductive and oxidative thermal treatments. Both materials are monophasic solid solutions. The determination of O/M ratio was achieved combining XRD, XANES and TGA, showing the consistence between the three methods. This study represents a further step in our investigation of the Th-Am-O system and improves it comprehension.|
|JRC Directorate:||Nuclear Safety and Security|
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