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dc.contributor.authorDIRNBERGER DANIELAen_GB
dc.contributor.authorKRAELING ULLIen_GB
dc.contributor.authorMUELLEJANS HARALDen_GB
dc.contributor.authorSALIS ELENAen_GB
dc.contributor.authorEMERY KEITHen_GB
dc.contributor.authorHISHIKAWA Y.en_GB
dc.contributor.authorKIEFER KLAUSen_GB
dc.date.accessioned2019-05-01T00:04:22Z-
dc.date.available2014-09-24en_GB
dc.date.available2019-05-01T00:04:22Z-
dc.date.created2014-09-22en_GB
dc.date.issued2014en_GB
dc.date.submitted2014-01-30en_GB
dc.identifier.citationMEASUREMENT SCIENCE & TECHNOLOGY vol. 25 no. 105005en_GB
dc.identifier.issn0957-0233en_GB
dc.identifier.urihttp://iopscience.iop.org/0957-0233/25/10/105005/en_GB
dc.identifier.urihttp://publications.jrc.ec.europa.eu/repository/handle/JRC88725-
dc.description.abstractMeasurement results from a world-wide intercomparison of PV module calibration are presented. Four PV reference laboratories in USA, Japan and Europe with different traceability chains, measurement equipment and procedures, as well as different uncertainty estimation concepts, participated. Seven PV modules of different technologies were measured (standard and high efficiency crystalline silicon, cadmium telluride, single- and double-junction amorphous and micromorph silicon). The measurement results from all laboratories and for all devices agreed well. Maximum power for the crystalline silicon samples was within ±1.3%, for all thin-film modules roughly within ±3%, which is very good compared to past intercomparisons. The agreement between the results was evaluated using a weighted mean as reference value which considers result-specific uncertainty, instead of the widely used unweighted arithmetic mean. A further statistical analysis of all deviations between results and corresponding reference mean showed that the uncertainties estimated by the participating laboratories are realistic, with a slight tendency towards being too conservative. The observed deviations of results from the reference mean concerned mainly short-circuit current and fill factor. Module stability was monitored through repeated measurements at Fraunhofer ISE before and after measurements at each of the other participating laboratories. Based on these measurements, stability problems that occurred for some thin film modules and influenced the results could be analyzed and explained in detail.en_GB
dc.description.sponsorshipJRC.F.7-Renewables and Energy Efficiencyen_GB
dc.format.mediumPrinteden_GB
dc.languageENGen_GB
dc.publisherIOP PUBLISHING LTDen_GB
dc.relation.ispartofseriesJRC88725en_GB
dc.titleProgress in photovoltaic module calibration: results of a worldwide intercomparison between four reference laboratoriesen_GB
dc.typeArticles in periodicals and booksen_GB
dc.identifier.doi10.1088/0957-0233/25/10/105005en_GB
JRC Directorate:Energy, Transport and Climate

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